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Short Abstract
This work summarizes the results obtained during the doctorate studies from 2005 to
2008. Most of the time has been spent at the Politecnico di Torino, and about eight
months at the National Institute of Standards and Technology, Boulder, Colorado.
The research focused on methods for accurate measurements of electrical quantities in the Radio Frequency and Microwave range. The applications involved multiport scattering parameter measurements, noise power and amplifier noise parameters extraction, large-signal transistor characterization and dielectric permittivity measurement.
[2] M. Garelli, A. Ferrero, and S. Bonino, “A complete noise- and scattering-parameters test-set,” IEEE Trans. Microw. Theory Tech., vol. 57, no. 3, pp. 716–724, Mar. 2009
[3] A. Ferrero, V. Teppati, M. Garelli, and A. Neri, “A novel calibration algorithm for a special class of multiport vector network analyzers,” IEEE Trans. Microw. Theory Tech., vol. 56, no. 3, pp. 693–699, Mar. 2008
[4] A. Ferrero, V. Teppati, M. Garelli, S. Bonino, and U. Pisani, “Software solutions for linear and non-linear microwave measurements and calibrations,” in 72nd ARFTG Conference Digest, Dec. 2008
[5] V. Teppati, A. Ferrero, M. Garelli, and S. Bonino, “A comprehensive mixed-mode time-domain load- and source-pull measurement system,” IEEE Trans. Instrum. Meas., forthcoming article.